Accepted Papers
The section containing accepted papers prior to their appearance in the forthcoming issues of Materials Science-Poland, is available on: Ahead of Print Articles.
Current Issue
The current issue (Vol. 43, No. 3, 2025) of the journal of Materials Science-Poland is now available on Sciendo.
For more details please, refer to the Sciendo website.
Back Issues
The Hydrogenation Process of the Gd3Ni Compound
N.V.Tristan1, T. Palewski1, H. Drulis2, L. Folcik2, S.A. Nikitin1,3
1International Laboratory of High Magnetic Fields and Low Temperatures, Wrocław, Poland
2Institute of Low Temperatures and Structure Research, Wrocław, Poland
3Faculty of Physics, Moscow State University, Vorobievy Gory, Russia
Semiconductor Heterostructures and Device Structures Investigated By Photoreflectance Spectroscopy
J. Misiewicz, P. Sitarek, G. Sęk, R. Kudrawiec
Institute of Physics, Wrocław University of Technology, Poland
Combined SNOM/AFM Microscopy with Micromachined Nanoapertures
J. Radojewski1, P. Grabiec2
1Faculty of Microsystem Electronics and Photonics, Wrocław University of Technology, Poland
2Institute of Electron Technology, Warsaw, Poland
Thermal Characterization of Copper Thin Films Made by Means of Sputtering
R.F. Szeloch, W.M. Posadkowski, T.P. Gotszalk, P.Janus, T. Kowaliw
Faculty of Microsystem Electronics and Photonics, Wrocław University of Technology, Poland
Application of Electrostatic Force Microscopy in Nanosystem Diagnostics
T.P. Gotszalk1, P. Grabiec2, I.W. Rangelow3
1Faculty of Microsystem Electronics and Photonics, Wrocław University of Technology, Poland
2Institute of Electron Technology, Warsaw, Poland
3Institute of Technological Physics, University of Kassel, Germany
Abstract
The current state of art of electrostatic force microscopy is described in the paper. The principle of electrostatic force operation enabling one to analyse local voltage distribution and capacitance is pre-sented. The design and properties of electrostatic force microscopy microprobes are discussed. The application and manufacturing process of piezoresistive cantilevers with conductive tips and of silicon beams with metallic probe are presented. In order to show the capabilities of electrostatic force micros-copy methods of investigations of local voltage distribution on surfaces of microelectronic integrated circuits (IC) are described. Improvements of electrostatic force microscopy and of other electrical meth-ods based on scanning probe microscopy confirm an increasing interest in electrical probing at the nanometre scale.
Hide abstract 
Download article (PDF)Wavelet Shrinkage-based Noise Reduction From The High Resolution X-ray Images of Epitaxial Layers
J. Kozłowski1, J. Serafińczuk1, A. Kozik2
1Faculty of Microsystem Electronics and Photonics, Wrocław University of Technology, Poland
2Institute of Engineering Cybernetics, Wrocław University of Technology, Poland
