Accepted Papers
The section containing accepted papers prior to their appearance in the forthcoming issues of Materials Science-Poland, is available on: Ahead of Print Articles.
Current Issue
The current issue (Vol. 43, No. 3, 2025) of the journal of Materials Science-Poland is now available on Sciendo.
For more details please, refer to the Sciendo website.
Back Issues
The Hydrogenation Process of the Gd3Ni Compound
N.V.Tristan1, T. Palewski1, H. Drulis2, L. Folcik2, S.A. Nikitin1,3
1International Laboratory of High Magnetic Fields and Low Temperatures, Wrocław, Poland
2Institute of Low Temperatures and Structure Research, Wrocław, Poland
3Faculty of Physics, Moscow State University, Vorobievy Gory, Russia
Semiconductor Heterostructures and Device Structures Investigated By Photoreflectance Spectroscopy
J. Misiewicz, P. Sitarek, G. Sęk, R. Kudrawiec
Institute of Physics, Wrocław University of Technology, Poland
Combined SNOM/AFM Microscopy with Micromachined Nanoapertures
J. Radojewski1, P. Grabiec2
1Faculty of Microsystem Electronics and Photonics, Wrocław University of Technology, Poland
2Institute of Electron Technology, Warsaw, Poland
Abstract
We describe a new combined SNOM/AFM cantilever probe with the aperture FIB micromachined in a hollow metal pyramid fabricated on its end. The cantilever can be used in a microscopy set-up with the optical or piezoresitive AFM detection system. A processing sequence proposed in the article offers a high reproducibility in batch processing typical of semiconductor technology. Morover, the angle of the apex cone is closed to 50° which renders it possible to obtain a high-aperture optical throughoutput. The probe construction, manufacturing and its basic optical parameters are described.
Hide abstract 
Download article (PDF)Thermal Characterization of Copper Thin Films Made by Means of Sputtering
R.F. Szeloch, W.M. Posadkowski, T.P. Gotszalk, P.Janus, T. Kowaliw
Faculty of Microsystem Electronics and Photonics, Wrocław University of Technology, Poland
Application of Electrostatic Force Microscopy in Nanosystem Diagnostics
T.P. Gotszalk1, P. Grabiec2, I.W. Rangelow3
1Faculty of Microsystem Electronics and Photonics, Wrocław University of Technology, Poland
2Institute of Electron Technology, Warsaw, Poland
3Institute of Technological Physics, University of Kassel, Germany
Wavelet Shrinkage-based Noise Reduction From The High Resolution X-ray Images of Epitaxial Layers
J. Kozłowski1, J. Serafińczuk1, A. Kozik2
1Faculty of Microsystem Electronics and Photonics, Wrocław University of Technology, Poland
2Institute of Engineering Cybernetics, Wrocław University of Technology, Poland
